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LEADING PROBING SYSTEMS FOR SEMICONDUCTORS

LEADING PROBING SYSTEMS FOR SEMICONDUCTORSLEADING PROBING SYSTEMS FOR SEMICONDUCTORSLEADING PROBING SYSTEMS FOR SEMICONDUCTORS

 Four Dimensions has manufactured advanced semiconductor probing systems since 1978. 

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About 4D

Our Expertise

 We provide Four-Point Probes with an extended measurement range for sophisticated probing of compound semiconductor wafers.  We offer the broadest range of mercury probe geometries and special capacitance measurement electronics.

Our Capabilities

Our Four Point Probe and CV map systems are found in hundreds of fabs and research institutions worldwide. Both manual loading and cassette-to-cassette systems are available.

More capable by design

For unique applications such as High Electron Mobility (HEMT) structures, MOS or MIS substrates, hysteresis in ferroelectrics, and ultra-shallow junction (USJ) carrier profiling with high lateral resolution part is thoroughly inspected before it leaves our facility.

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