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Four Point Probe systems
Four Dimensions' Four Point Probe systems measure the sheet resistance / resistivity / thickness of a wide range of materials. We offer a wide range of models, options, and probe heads to suit your materials', measurement, and budget needs. We can also tailor systems to your special requirements.
HG PROBE C-V/I-VCV MAP SERIES
HG PROBE C-V/I-VCV MAP SERIES
OurCVmapsystems perform capacitance-voltage (C-V) and current-voltage (I-V) measurements directly on an unmetallized wafer using a uniquely designed Mercury probe.
Automated system
Cassette to cassette Fully automated to meet production demands
Our automated Mercury probe systems come with unique capacitance and current meters that can perform C-V, I-V, Q-V, as well as V-t measurements. These measurements allow a wide range of sample characterization:
- Oxide integrity monitoring
- Doping density profiling, low dose ion implantation monitoring, and USJ doping profiling
- Carrier lifetime extraction
- Resistivity measurements of semi-insulating materials
- Pseudo MOST characterization of SOI structures (B systems)
- Ferroelectric sample investigations
- Poly Silicon characterization
