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Expertise
We provide four-point probes and CVmap systems with an extended measurement range or sophisticated probing for compound semiconductors. Our latest innovation is a Modified four-point probe for measuring pn junction leakage and sheet resistivity in the same probing step, meeting the requirements for ultra-shallow junction probing.
Quality
Quality is at the core of everything we do. We have a dedicated quality control department to ensure all products meet our strict standards. We stand behind our products and are committed to customer satisfaction.
Founded in 1978
Founded in 1978 by Dr. James T.C. Chen, Four Dimensions, Inc. began with developing six-point and manual probe systems. We are developing fully automated four-point probe and CVmap systems for today's metrology needs. Today, Four Dimensions, Inc. is at the forefront of developing leading technology for ultra-shallow junction characterization.
